Effect of oxygen vacancies on dielectric property and reliability of anti-ferroelectric PLZT applicable to EV-MLCC

  • Jeoung Sik Choi
  • , Dong Chul Kim
  • , Hyo Soon Shin
  • , Dong Hun Yeo
  • , Joon Hyung Lee

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Effect of oxygen vacancies on dielectric property and reliability of anti-ferroelectric PLZT applicable to EV-MLCC'. Together they form a unique fingerprint.

Material Science