Effect of substitution of Dy3+ on dielectric constant and reliability of anti-ferroelectric PLZT

Jeoung Sik Choi; Dong Chul Kim; Hyo Soon Shin; Dong Hun Yeo; Joon Hyung Lee

doi:10.1557/s43579-023-00443-1

Effect of substitution of Dy³⁺ on dielectric constant and reliability of anti-ferroelectric PLZT

Jeoung Sik Choi, Dong Chul Kim, Hyo Soon Shin, Dong Hun Yeo, Joon Hyung Lee

Research output: Contribution to journal › Article › peer-review

Abstract

The study aimed to investigate the impact of oxygen vacancies on the reliability of perovskite-structured ceramics. In particular, the focus was on anti-ferroelectric (PbLa)(ZrTi)O₃, commonly known as PLZT, which exhibits excellent DC-bias characteristics, making it a promising material for high-power capacitors. To address the issue of oxygen vacancies, Dy³⁺ was introduced as a donor by substituting it into (Pb_0.82La_0.12)(Zr_0.86Ti_0.14)O₃. As the substitution of Dy³⁺ increased, there was a decrease in the dielectric constant. However, this was accompanied by an increase in both breakdown voltage and reliability characteristics. Graphical abstract: [Figure not available: see fulltext.].

Original language	English
Pages (from-to)	1260-1265
Number of pages	6
Journal	MRS Communications
Volume	13
Issue number	6
DOIs	https://doi.org/10.1557/s43579-023-00443-1
State	Published - Dec 2023

Keywords

Defects
Dy
Electrical properties
Perovskites

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10.1557/s43579-023-00443-1

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title = "Effect of substitution of Dy3+ on dielectric constant and reliability of anti-ferroelectric PLZT",

abstract = "The study aimed to investigate the impact of oxygen vacancies on the reliability of perovskite-structured ceramics. In particular, the focus was on anti-ferroelectric (PbLa)(ZrTi)O3, commonly known as PLZT, which exhibits excellent DC-bias characteristics, making it a promising material for high-power capacitors. To address the issue of oxygen vacancies, Dy3+ was introduced as a donor by substituting it into (Pb0.82La0.12)(Zr0.86Ti0.14)O3. As the substitution of Dy3+ increased, there was a decrease in the dielectric constant. However, this was accompanied by an increase in both breakdown voltage and reliability characteristics. Graphical abstract: [Figure not available: see fulltext.].",

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author = "Choi, {Jeoung Sik} and Kim, {Dong Chul} and Shin, {Hyo Soon} and Yeo, {Dong Hun} and Lee, {Joon Hyung}",

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T1 - Effect of substitution of Dy3+ on dielectric constant and reliability of anti-ferroelectric PLZT

AU - Choi, Jeoung Sik

AU - Kim, Dong Chul

AU - Shin, Hyo Soon

AU - Yeo, Dong Hun

AU - Lee, Joon Hyung

PY - 2023/12

Y1 - 2023/12

N2 - The study aimed to investigate the impact of oxygen vacancies on the reliability of perovskite-structured ceramics. In particular, the focus was on anti-ferroelectric (PbLa)(ZrTi)O3, commonly known as PLZT, which exhibits excellent DC-bias characteristics, making it a promising material for high-power capacitors. To address the issue of oxygen vacancies, Dy3+ was introduced as a donor by substituting it into (Pb0.82La0.12)(Zr0.86Ti0.14)O3. As the substitution of Dy3+ increased, there was a decrease in the dielectric constant. However, this was accompanied by an increase in both breakdown voltage and reliability characteristics. Graphical abstract: [Figure not available: see fulltext.].

AB - The study aimed to investigate the impact of oxygen vacancies on the reliability of perovskite-structured ceramics. In particular, the focus was on anti-ferroelectric (PbLa)(ZrTi)O3, commonly known as PLZT, which exhibits excellent DC-bias characteristics, making it a promising material for high-power capacitors. To address the issue of oxygen vacancies, Dy3+ was introduced as a donor by substituting it into (Pb0.82La0.12)(Zr0.86Ti0.14)O3. As the substitution of Dy3+ increased, there was a decrease in the dielectric constant. However, this was accompanied by an increase in both breakdown voltage and reliability characteristics. Graphical abstract: [Figure not available: see fulltext.].

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KW - Electrical properties

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Effect of substitution of Dy³⁺ on dielectric constant and reliability of anti-ferroelectric PLZT

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Keywords

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