Effects of ambient atmosphere on the transfer characteristics and gate-bias stress stability of amorphous indium-gallium-zinc oxide thin-film transistors

Sang Yun Sung, Jun Hyuk Choi, Un Bin Han, Ki Chang Lee, Joon Hyung Lee, Jeong Joo Kim, Wantae Lim, S. J. Pearton, D. P. Norton, Young Woo Heo

Research output: Contribution to journal › Article › peer-review

150 Scopus citations

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