Effects of Electrical Stress on the Mid-Gap Interface Trap Density and the Capture Cross Sections Characterized by Pulsed Interface Probing (PIP) Measurements

Hyuck In Kwon, In Man Kang, Byung Gook Park, Jong Duk Lee, Woo Suk Hyun, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee

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