Abstract
The effects of high-dose manganese (Mn) implantation into ZnO thin films grown on sapphire substrates which produces ferromagnetism for n-type doping levels were discussed. The ZnO films were grown by pulse-laser deposition on c-plane Al 2O 3 substrates. It was observed that films showed n-type carrier concentration in the range of 2-5 × 10 20 cm -3 and room temperature hysteresis in magnetization loops, after Mn implantation and subsequent annealing at 600°C. The coercivity and saturation magnetization were strong functions of the annealing temperature and thus carrier concentrations, crystalline quality and residual defects account for the magnetic properties of ZnO:Mn.
| Original language | English |
|---|---|
| Pages (from-to) | 2292-2294 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 13 |
| DOIs | |
| State | Published - 29 Mar 2004 |