Effects of high dose proton irradiation on the electrical performance of ZnO Schottky diodes

Rohit Khanna, K. Ip, K. K. Allums, K. Baik, C. R. Abernathy, S. J. Pearton, Y. W. Heo, D. P. Norton, F. Ren, R. Dwivedi, T. N. Fogarty, R. Wilkins

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12 Scopus citations

Abstract

Bulk ZnO Schottky rectifiers with Pt rectifying contacts were exposed to 40 MeV protons at fluences from 5 × 109 to 5 × 10 10 cm-2. These doses correspond to that received in more than 10 or 100 years, respectively, in low earth satellite orbit. The reverse breakdown voltage of the ZnO diodes increased from ∼3.2 V (taken at a current density of 0.1 A/cm2) in unirradiated devices to ∼3.9 V after the highest proton dose. The effective barrier height decreased with proton dose from 0.37 eV to 0.35 eV while the diode ideality factor increased from 1.8 to 1.9 for the 5 × 1010 dose. The very high tolerance of the ZnO diodes to high doses of energetic protons suggests that this material is well-suited to applications requiring high radiation tolerance.

Original languageEnglish
Pages (from-to)R79-R82
JournalPhysica Status Solidi (A) Applied Research
Volume201
Issue number12
DOIs
StatePublished - Sep 2004

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