Skip to main navigation Skip to search Skip to main content

Electric-field-induced mass movement of Ge2Sb2Te 5 in bottleneck geometry line structures

  • Sung Wook Nam
  • , Dongbok Lee
  • , Min Ho Kwon
  • , Dongmin Kang
  • , Cheolkyu Kim
  • , Tae Yon Lee
  • , Sung Heo
  • , Young Wook Park
  • , Kipil Lim
  • , Hyo Sung Lee
  • , Jung Sub Wi
  • , Kyung Woo Yi
  • , Yoonho Khang
  • , Ki Bum Kim
  • Seoul National University
  • Samsung

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

We report an electric-field-induced directional mass movement of Ge 2Sb2Te5 in bottleneck geometry. Under high-electric-stress circumstances (> 106 A cm-2), a mass of Ge 2Sb2Te5 tends to move toward the cathode (-) by the remaining mass depletion at the anode (+). The high electric stress induces an asymmetric compositional separation such that Sb is distributed toward the cathode (-) whereas Te is distributed toward the anode (+). Ionicity in Ge 2Sb2Te5 at high temperature and high electric stress can be one of the origins of the asymmetric behavior. The electric-field-induced mass movement may provide insight on the device reliability of phase-change random access memory.

Original languageEnglish
Pages (from-to)H155-H159
JournalElectrochemical and Solid-State Letters
Volume12
Issue number4
DOIs
StatePublished - 2009

Fingerprint

Dive into the research topics of 'Electric-field-induced mass movement of Ge2Sb2Te 5 in bottleneck geometry line structures'. Together they form a unique fingerprint.

Cite this