TY - JOUR
T1 - Electrical spin injection and detection in semimetallic Bi and Bi-Pb films
AU - Lee, Kyoung Il
AU - Roh, Jong Wook
AU - Chang, Joonyeon
AU - Han, Suk Hee
AU - Shin, Kyung Ho
AU - Jeung, Won Yong
AU - Johnson, Mark
AU - Lee, Wooyoung
PY - 2009/5/1
Y1 - 2009/5/1
N2 - The spin injection technique is extended to semimetal bismuth samples in a lateral spin valve geometry. We study spin injection, diffusion, and detection in a material system where a small change in sample stoichiometry results in a large change in the electronic and spin dependent transport properties of the nonmagnetic material. Measurements of magnetoresistance, using a magnetic field applied in the sample plane, as well as the Hanle effect, using a field applied perpendicular to the sample plane, are reported. We demonstrate two remarkable results: (i) a spin diffusion length of 230 μm (T=2 K) in a BiPb sample with temperature dependent resistivity, ρ (T), which decreases with decreasing T is the longest known value in a thin film; (ii) the interfacial spin polarization is 10% in BiPb samples with decreasing ρ (T) and an order of magnitude smaller (0.8%) in Bi samples where ρ (T) increases with decreasing T.
AB - The spin injection technique is extended to semimetal bismuth samples in a lateral spin valve geometry. We study spin injection, diffusion, and detection in a material system where a small change in sample stoichiometry results in a large change in the electronic and spin dependent transport properties of the nonmagnetic material. Measurements of magnetoresistance, using a magnetic field applied in the sample plane, as well as the Hanle effect, using a field applied perpendicular to the sample plane, are reported. We demonstrate two remarkable results: (i) a spin diffusion length of 230 μm (T=2 K) in a BiPb sample with temperature dependent resistivity, ρ (T), which decreases with decreasing T is the longest known value in a thin film; (ii) the interfacial spin polarization is 10% in BiPb samples with decreasing ρ (T) and an order of magnitude smaller (0.8%) in Bi samples where ρ (T) increases with decreasing T.
UR - http://www.scopus.com/inward/record.url?scp=65649151077&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.79.195201
DO - 10.1103/PhysRevB.79.195201
M3 - Article
AN - SCOPUS:65649151077
SN - 1098-0121
VL - 79
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 19
M1 - 195201
ER -