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Electron beam projection nanopatterning using crystal lattice images obtained from high resolution transmission electron microscopy

  • H. S. Lee
  • , B. S. Kim
  • , H. M. Kim
  • , J. S. Wi
  • , S. W. Nam
  • , K. B. Kim
  • , Y. Arai
  • Seoul National University
  • JEOL Ltd.

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have developed a new electron beam projection lithography technique for nanometer-scale patterning utilizing the Ångstrom-scale lattice images which can be obtained by HRTEM. We successfully fabricated periodic arrays of various patterned structures with feature sizes of about 25 nm using single-crystalline Si and β-Si3́N4 as the mask materials.

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 2007; 20th International Microprocesses and Nanotechnology Conference, MNC
Pages418-419
Number of pages2
DOIs
StatePublished - 2007
Events20th International Microprocesses and Nanotechnology Conference, MNC 2007 - Kyoto, Japan
Duration: 5 Nov 20078 Nov 2007

Publication series

NameDigest of Papers - Microprocesses and Nanotechnology 2007; 20th International Microprocesses and Nanotechnology Conference, MNC

Conference

Conferences20th International Microprocesses and Nanotechnology Conference, MNC 2007
Country/TerritoryJapan
CityKyoto
Period5/11/078/11/07

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