@inproceedings{bbadb330dd904b94844f836665e6d096,
title = "Energy-efficient all fiber-based local body heat mapping circuitry combining thermistor and memristor for wearable healthcare device",
abstract = "This study demonstrated a wearable and flexible temperature sensing circuitry for a diagnosis of skin temperature. This system is based on a novel carbon nanotubes (CNTs)-based temperature sensor (CTS) array, built on cotton yarn using a mixture of multi-walled (MW)-CNTs and PDMS (polydimethylsiloxane). To divide and select the unit thermistors, a memristor which operates in the normally-off state was utilized. To construct the memristors, an Al precursor-based solution dip coating method and initiated chemical vapor deposition (iCVD) were employed for the metal electrode and resistive switching layer (RSL), respectively. Using the aforementioned processes, aluminum (Al) electrode and poly (ethylene glycol methacrylate, pEGDMA)-RSL layers were deposited on a cotton yarn backbone. A unit temperature sensor based on the proposed circuitry was fabricated by intersecting the Al/pEGDMA-coated yarns to both sides of the CTS wire, while forming a 1-thermistor and 2-memristor (1T-2M). This architecture exhibited promising performance as a sensor-array system for a fully fabric-based wearable healthcare device.",
author = "Hagyoul Bae and Kim, {Weon Guk} and Hongkeun Park and Jeon, {Seung Bae} and Jung, {Soo Ho} and Lee, {Hye Moon} and Kim, {Myung Su} and Tcho, {Il Woong} and Jang, {Byung Chul} and Hwon Im and Choi, {Sung Yool} and Im, {Sung Gap} and Choi, {Yang Kyu}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 63rd IEEE International Electron Devices Meeting, IEDM 2017 ; Conference date: 02-12-2017 Through 06-12-2017",
year = "2018",
month = jan,
day = "23",
doi = "10.1109/IEDM.2017.8268416",
language = "English",
series = "Technical Digest - International Electron Devices Meeting, IEDM",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "18.4.1--18.4.4",
booktitle = "2017 IEEE International Electron Devices Meeting, IEDM 2017",
address = "United States",
}