Existence of a Cu3Au-type ordered structure in Cd xZn1-xTe epilayers grown on (100) GaAs substrates

H. S. Lee; S. Yi; T. W. Kim; Y. J. Park; J. Y. Lee; M. S. Kwon; H. L. Park

doi:10.1016/j.ssc.2005.10.007

Existence of a Cu₃Au-type ordered structure in Cd _xZn_1-xTe epilayers grown on (100) GaAs substrates

H. S. Lee, S. Yi, T. W. Kim, Y. J. Park, J. Y. Lee, M. S. Kwon, H. L. Park

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4 Scopus citations

Abstract

Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in Cd_xZn_1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu₃Au-type ordered structure was formed in the Cd_xZn_1-xTe epilayer. The present results can help improve understanding of the Cu₃Au-type ordered structures in Cd_xZn_1-xTe epilayers grown on GaAs substrates.

Original language	English
Pages (from-to)	70-73
Number of pages	4
Journal	Solid State Communications
Volume	137
Issue number	1-2
DOIs	https://doi.org/10.1016/j.ssc.2005.10.007
State	Published - Jan 2006

Keywords

A. Semiconductor
C. Transmission electron microscopy
D. Order-disorder effects

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10.1016/j.ssc.2005.10.007

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title = "Existence of a Cu3Au-type ordered structure in Cd xZn1-xTe epilayers grown on (100) GaAs substrates",

abstract = "Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1-xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.",

keywords = "A. Semiconductor, C. Transmission electron microscopy, D. Order-disorder effects",

author = "Lee, {H. S.} and S. Yi and Kim, {T. W.} and Park, {Y. J.} and Lee, {J. Y.} and Kwon, {M. S.} and Park, {H. L.}",

year = "2006",

month = jan,

doi = "10.1016/j.ssc.2005.10.007",

language = "English",

volume = "137",

pages = "70--73",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Ltd.",

number = "1-2",

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TY - JOUR

T1 - Existence of a Cu3Au-type ordered structure in Cd xZn1-xTe epilayers grown on (100) GaAs substrates

AU - Lee, H. S.

AU - Yi, S.

AU - Kim, T. W.

AU - Park, Y. J.

AU - Lee, J. Y.

AU - Kwon, M. S.

AU - Park, H. L.

PY - 2006/1

Y1 - 2006/1

N2 - Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1-xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.

AB - Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1-xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.

KW - A. Semiconductor

KW - C. Transmission electron microscopy

KW - D. Order-disorder effects

UR - http://www.scopus.com/inward/record.url?scp=28844466076&partnerID=8YFLogxK

U2 - 10.1016/j.ssc.2005.10.007

DO - 10.1016/j.ssc.2005.10.007

M3 - Article

AN - SCOPUS:28844466076

SN - 0038-1098

VL - 137

SP - 70

EP - 73

JO - Solid State Communications

JF - Solid State Communications

IS - 1-2

ER -

Existence of a Cu₃Au-type ordered structure in Cd _xZn_1-xTe epilayers grown on (100) GaAs substrates

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Keywords

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