Extremely bias stress stable enhancement mode sol–gel-processed SnO2 thin-film transistors with Y2O3 passivation layers
- Changmin Lee
- , Won Yong Lee
- , Do Won Kim
- , Hyeon Joong Kim
- , Jin Hyuk Bae
- , In Man Kang
- , Doohyeok Lim
- , Kwangeun Kim
- , Jaewon Jang
Research output: Contribution to journal › Article › peer-review
30
Scopus
citations