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Extremely bias stress stable enhancement mode sol–gel-processed SnO2 thin-film transistors with Y2O3 passivation layers
Changmin Lee, Won Yong Lee, Do Won Kim, Hyeon Joong Kim, Jin Hyuk Bae, In Man Kang, Doohyeok Lim, Kwangeun Kim, Jaewon Jang
Research output: Contribution to journal › Article › peer-review
26
Scopus
citations