Abstract
We demonstrate a very precise cavity-mode control scheme in a 1.55 μm multiple-wavelength vertical-cavity surface-emitting laser (VCSEL) array. For the precise control of the cavity mode, selective wet etchings of InP and InAlGaAs superlattice tuning layers are investigated using HC1/H2O and H3PO3/H2O2/H2O solution systems, respectively. The average calibrated cavity-mode spacing between channels for the fabricated eight-channel full VCSEL array structure is approximately 0.9 nm, which agrees well with the calculated value of 0.8 nm.
| Original language | English |
|---|---|
| Pages (from-to) | 137-139 |
| Number of pages | 3 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 43 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2004 |
Keywords
- Cavity mode
- InAlGaAs
- InP
- Laser array
- MOCVD
- Selective etching
- Vertical-cavity surface-emitting laser (VCSEL)
- WDM