Fabrication of AC-coupled double-sided silicon strip sensor

D. H. Kah, J. B. Bae, H. J. Hyun, H. J. Kim, H. O. Kim, H. Park

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The AC-coupled double-sided silicon microstrip sensors are designed and 14 masks are used to produce prototype strip sensors. The biasing resistors are made of p-doped polysilicons and the coupling capacitors are built by separating implanted strips and readout strips by a thin oxide layer. The p-stops in the atoll patterns are introduced to disrupt an electron accumulation layer at the SiSiO2 interface on the ohmic side. The junction side has a double metal structure using two metal layers separated from each other by a thick insulator layer. The strip sensors are fabricated on a 5-in., high resistivity, 〈100〉-orientation, and 380μm thick n-type double-sided polished silicon wafer. The prototype sensor with an area of 2.8×2.8cm2 consists of 256(512) readout channels with a strip pitch of 100(50)μm. The leakage currents and the bulk capacitances as a function of the reverse bias voltage are measured to understand the fabrication process of the prototype sensors. The signal to noise ratios are measured by using a 90Sr radioactive source in order to evaluate performance of the sensors. The design of the AC-coupled double-sided silicon strip sensor and its various components are described, and measurements of the electric characteristics and the signal to noise ratio are presented.

Original languageEnglish
Pages (from-to)213-215
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume623
Issue number1
DOIs
StatePublished - 1 Nov 2010

Keywords

  • Double-sided silicon strip sensor
  • Radiation detector
  • Semiconductor detector
  • Signal to noise ratio

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