Abstract
The AC-coupled double-sided silicon microstrip sensors are designed and 14 masks are used to produce prototype strip sensors. The biasing resistors are made of p-doped polysilicons and the coupling capacitors are built by separating implanted strips and readout strips by a thin oxide layer. The p-stops in the atoll patterns are introduced to disrupt an electron accumulation layer at the SiSiO2 interface on the ohmic side. The junction side has a double metal structure using two metal layers separated from each other by a thick insulator layer. The strip sensors are fabricated on a 5-in., high resistivity, 〈100〉-orientation, and 380μm thick n-type double-sided polished silicon wafer. The prototype sensor with an area of 2.8×2.8cm2 consists of 256(512) readout channels with a strip pitch of 100(50)μm. The leakage currents and the bulk capacitances as a function of the reverse bias voltage are measured to understand the fabrication process of the prototype sensors. The signal to noise ratios are measured by using a 90Sr radioactive source in order to evaluate performance of the sensors. The design of the AC-coupled double-sided silicon strip sensor and its various components are described, and measurements of the electric characteristics and the signal to noise ratio are presented.
| Original language | English |
|---|---|
| Pages (from-to) | 213-215 |
| Number of pages | 3 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| Volume | 623 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Nov 2010 |
Keywords
- Double-sided silicon strip sensor
- Radiation detector
- Semiconductor detector
- Signal to noise ratio