Fast industrial inspection of optical thin film using optical coherence tomography
- Muhammad Faizan Shirazi
- , Kibeom Park
- , Ruchire Eranga Wijesinghe
- , Hyosang Jeong
- , Sangyeob Han
- , Pilun Kim
- , Mansik Jeon
- , Jeehyun Kim
Research output: Contribution to journal › Article › peer-review
53
Scopus
citations