TY - GEN
T1 - Ferroelectric memory design based on grounded-plate PMOS-gate cell architecture
AU - Chung, Yeonbae
AU - Kim, Jung Hyun
AU - Yoon, Jae Eun
N1 - Publisher Copyright:
©2003 IEEE.
PY - 2003
Y1 - 2003
N2 - This paper proposes a new FRAM design style based on grounded-plate PMOS-gate (GPPG) cell architecture. A GPPG cell consists of a PMOS access transistor and a ferroelectric capacitor. Its plate is grounded. The proposed scheme employs three novel operating methods: 1) VDD precharged bitline, 2) negative-voltage wordline technique and 3) negative-pulse restore. Because this configuration doesn't need the on-pitch plate control circuitry, it is effective in realizing cost-effective chip sizes. Implementation for an experimental 2.5-V, 2-Mb FRAM prototype design in a 0.5-μm technology shows a cell array efficiency of 57 %, access time of 85 ns and an active current of 12 mA, respectively.
AB - This paper proposes a new FRAM design style based on grounded-plate PMOS-gate (GPPG) cell architecture. A GPPG cell consists of a PMOS access transistor and a ferroelectric capacitor. Its plate is grounded. The proposed scheme employs three novel operating methods: 1) VDD precharged bitline, 2) negative-voltage wordline technique and 3) negative-pulse restore. Because this configuration doesn't need the on-pitch plate control circuitry, it is effective in realizing cost-effective chip sizes. Implementation for an experimental 2.5-V, 2-Mb FRAM prototype design in a 0.5-μm technology shows a cell array efficiency of 57 %, access time of 85 ns and an active current of 12 mA, respectively.
UR - http://www.scopus.com/inward/record.url?scp=84946415055&partnerID=8YFLogxK
U2 - 10.1109/EDSSC.2003.1283482
DO - 10.1109/EDSSC.2003.1283482
M3 - Conference contribution
AN - SCOPUS:84946415055
T3 - 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
SP - 55
EP - 58
BT - 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
Y2 - 16 December 2003 through 18 December 2003
ER -