Field emission characteristics of an individual carbon nanotube inside a field emission-scanning electron microscope

H. S. Jang, S. O. Kang, S. H. Nahm, Y. I. Kim, B. G. Min, D. H. Kim, H. R. Lee

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Field emission (FE) properties of individual single-walled carbon nanotubes (SWCNT) were investigated inside a field emission-scanning electron microscopy. The individual SWCNT turned on a voltage of 23 V defined to produce a current of 10 pA, and was saturated at around 43 V and 880 nA. The FE characteristic of individual SWCNT also followed a conventional Fowler-Nordheim (F-N) theory in which a single linear slope in the F-N plots is measured below their limit of current level corresponding to the saturation regime of emission current. Energy-dispersive X-ray spectroscopy analysis showed that carbon atoms were deposited on the anode surface by the local heating of SWCNT tip during the FE processes and indicated about atomic 83% of carbon atoms. The carbon atoms were newly found to be evaporated and deposited on the anode surface during the FE process such that it was assumed that the degradation of FE was caused by evaporation and deposition of carbon atoms during the FE process.

Original languageEnglish
Pages (from-to)422-426
Number of pages5
JournalVacuum
Volume81
Issue number4
DOIs
StatePublished - 6 Nov 2006

Keywords

  • Carbon nanotubes
  • Electron microscope
  • Field emission

Fingerprint

Dive into the research topics of 'Field emission characteristics of an individual carbon nanotube inside a field emission-scanning electron microscope'. Together they form a unique fingerprint.

Cite this