Finite element analysis of charge injection and transport in a dielectric liquid

Se Hee Lee; Francis O'Sullivan; Il Han Park; Markus Zahn; Leif Pettersson; Rongsheng Liu; Olof Hjortstam; Albert Jaksts; Tommaso Auletta; Uno Gafvert

doi:10.1109/CEIDP.2006.312078

Finite element analysis of charge injection and transport in a dielectric liquid

Se Hee Lee
, Francis O'Sullivan
, Il Han Park
, Markus Zahn
, Leif Pettersson
, Rongsheng Liu
, Olof Hjortstam
, Albert Jaksts
, Tommaso Auletta
, Uno Gafvert

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

8 Scopus citations

Abstract

Unipolar and bipolar space charge injection and propagation is analyzed under simplified linear and Fowler-Nordheim charge injection conditions for parallel plane or needle-sphere electrodes stressed by a step voltage. To verify our finite element numerical method, we first tested parallel plane electrodes with a simplified linear charge injection law for unipolar space charge propagation that showed good agreement with older closed form theoretical analysis. Finally, we analyzed tip-sphere electrodes for bipolar space charge propagation including Langevin recombination using finite element analysis.

Original language	English
Title of host publication	2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Pages	129-132
Number of pages	4
DOIs	https://doi.org/10.1109/CEIDP.2006.312078
State	Published - 2006
Event	2006 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Kansas City, MO, United States Duration: 15 Oct 2006 → 18 Oct 2006

Publication series

Name	Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ISSN (Print)	0084-9162

Conference

Conference	2006 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Country/Territory	United States
City	Kansas City, MO
Period	15/10/06 → 18/10/06

Access to Document

10.1109/CEIDP.2006.312078

Cite this

Lee, S. H., O'Sullivan, F., Park, I. H., Zahn, M., Pettersson, L., Liu, R., Hjortstam, O., Jaksts, A., Auletta, T., & Gafvert, U. (2006). Finite element analysis of charge injection and transport in a dielectric liquid. In 2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 129-132). Article 4105386 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). https://doi.org/10.1109/CEIDP.2006.312078

@inproceedings{9cceea2a7e0948b7b9afbe5beabef21c,

title = "Finite element analysis of charge injection and transport in a dielectric liquid",

abstract = "Unipolar and bipolar space charge injection and propagation is analyzed under simplified linear and Fowler-Nordheim charge injection conditions for parallel plane or needle-sphere electrodes stressed by a step voltage. To verify our finite element numerical method, we first tested parallel plane electrodes with a simplified linear charge injection law for unipolar space charge propagation that showed good agreement with older closed form theoretical analysis. Finally, we analyzed tip-sphere electrodes for bipolar space charge propagation including Langevin recombination using finite element analysis.",

author = "Lee, \{Se Hee\} and Francis O'Sullivan and Park, \{Il Han\} and Markus Zahn and Leif Pettersson and Rongsheng Liu and Olof Hjortstam and Albert Jaksts and Tommaso Auletta and Uno Gafvert",

year = "2006",

doi = "10.1109/CEIDP.2006.312078",

language = "English",

isbn = "1424405475",

series = "Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP",

pages = "129--132",

booktitle = "2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP",

note = "2006 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP ; Conference date: 15-10-2006 Through 18-10-2006",

}

Lee, SH, O'Sullivan, F, Park, IH, Zahn, M, Pettersson, L, Liu, R, Hjortstam, O, Jaksts, A, Auletta, T & Gafvert, U 2006, Finite element analysis of charge injection and transport in a dielectric liquid. in 2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP., 4105386, Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, pp. 129-132, 2006 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, Kansas City, MO, United States, 15/10/06. https://doi.org/10.1109/CEIDP.2006.312078

Finite element analysis of charge injection and transport in a dielectric liquid. / Lee, Se Hee; O'Sullivan, Francis; Park, Il Han et al.
2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2006. p. 129-132 4105386 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Finite element analysis of charge injection and transport in a dielectric liquid

AU - Lee, Se Hee

AU - O'Sullivan, Francis

AU - Park, Il Han

AU - Zahn, Markus

AU - Pettersson, Leif

AU - Liu, Rongsheng

AU - Hjortstam, Olof

AU - Jaksts, Albert

AU - Auletta, Tommaso

AU - Gafvert, Uno

PY - 2006

Y1 - 2006

N2 - Unipolar and bipolar space charge injection and propagation is analyzed under simplified linear and Fowler-Nordheim charge injection conditions for parallel plane or needle-sphere electrodes stressed by a step voltage. To verify our finite element numerical method, we first tested parallel plane electrodes with a simplified linear charge injection law for unipolar space charge propagation that showed good agreement with older closed form theoretical analysis. Finally, we analyzed tip-sphere electrodes for bipolar space charge propagation including Langevin recombination using finite element analysis.

AB - Unipolar and bipolar space charge injection and propagation is analyzed under simplified linear and Fowler-Nordheim charge injection conditions for parallel plane or needle-sphere electrodes stressed by a step voltage. To verify our finite element numerical method, we first tested parallel plane electrodes with a simplified linear charge injection law for unipolar space charge propagation that showed good agreement with older closed form theoretical analysis. Finally, we analyzed tip-sphere electrodes for bipolar space charge propagation including Langevin recombination using finite element analysis.

UR - https://www.scopus.com/pages/publications/33947707746

U2 - 10.1109/CEIDP.2006.312078

DO - 10.1109/CEIDP.2006.312078

M3 - Conference contribution

AN - SCOPUS:33947707746

SN - 1424405475

SN - 9781424405473

T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

SP - 129

EP - 132

BT - 2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

T2 - 2006 Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Y2 - 15 October 2006 through 18 October 2006

ER -

Lee SH, O'Sullivan F, Park IH, Zahn M, Pettersson L, Liu R et al. Finite element analysis of charge injection and transport in a dielectric liquid. In 2006 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2006. p. 129-132. 4105386. (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). doi: 10.1109/CEIDP.2006.312078

Finite element analysis of charge injection and transport in a dielectric liquid

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