Abstract
Resistive random access memory based on polymer thin films has been developed as a promising flexible nonvolatile memory for flexible electronic systems. Memory plays an important role in all modern electronic systems for data storage, processing, and communication; thus, the development of flexible memory is essential for the realization of flexible electronics. However, the existing solution-processed, polymer-based RRAMs have exhibited serious drawbacks in terms of the uniformity, electrical stability, and long-term stability of the polymer thin films. Here, we present poly(1,3,5-trimethyl-1,3,5-trivinyl cyclotrisiloxane) (pV3D3)-based RRAM arrays fabricated via the solvent-free technique called initiated chemical vapor deposition (iCVD) process for flexible memory application. Because of the outstanding chemical stability of pV3D3 films, the pV3D3-RRAM arrays can be fabricated by a conventional photolithography process. The pV3D3-RRAM on flexible substrates showed unipolar resistive switching memory with an on/off ratio of over 107, stable retention time for 105 s, excellent cycling endurance over 105 cycles, and robust immunity to mechanical stress. In addition, pV3D3-RRAMs showed good uniformity in terms of device-to-device distribution. The pV3D3-RRAM will pave the way for development of next-generation flexible nonvolatile memory devices.
| Original language | English |
|---|---|
| Pages (from-to) | 12951-12958 |
| Number of pages | 8 |
| Journal | ACS applied materials & interfaces |
| Volume | 8 |
| Issue number | 20 |
| DOIs | |
| State | Published - 25 May 2016 |
Keywords
- Cu filament
- flexible memory
- highly cross-linked-polymer
- initiated chemical vapor deposition (iCVD)
- polymer RRAM
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