Abstract
We analyzed bulk CuIn3Se5 alloys via transmission electron microscopy (TEM). The high-resolution TEM micrographs showed many twinning bands and doublet periodicity of the (0 0 2) lattice planes and corresponding fast Fourier transform patterns revealed the superstructure reflections. The selected area electron diffraction pattern showed the nearly five-fold rotation diffraction spots, which resulted from the four-fold rotation twinning at one point and other twinning bands. The TEM results indicated the CuIn3Se5 alloy deformed by hot press had many multiple-twinned crystallites as well as a high density of twinning in the {1 1 2} planes.
Original language | English |
---|---|
Article number | 128251 |
Journal | Materials Letters |
Volume | 276 |
DOIs | |
State | Published - 1 Oct 2020 |
Keywords
- Crystal structure
- Defect
- Electron microscopy
- Microstructure
- Semiconductor