Abstract
We analyzed bulk CuIn3Se5 alloys via transmission electron microscopy (TEM). The high-resolution TEM micrographs showed many twinning bands and doublet periodicity of the (0 0 2) lattice planes and corresponding fast Fourier transform patterns revealed the superstructure reflections. The selected area electron diffraction pattern showed the nearly five-fold rotation diffraction spots, which resulted from the four-fold rotation twinning at one point and other twinning bands. The TEM results indicated the CuIn3Se5 alloy deformed by hot press had many multiple-twinned crystallites as well as a high density of twinning in the {1 1 2} planes.
| Original language | English |
|---|---|
| Article number | 128251 |
| Journal | Materials Letters |
| Volume | 276 |
| DOIs | |
| State | Published - 1 Oct 2020 |
Keywords
- Crystal structure
- Defect
- Electron microscopy
- Microstructure
- Semiconductor
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