Full-chip multiple TSV-to-TSV coupling extraction and optimization in 3D ICs

Taigon Song, Chang Liu, Yarui Peng, Sung Kyu Lim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

32 Scopus citations

Abstract

TSV-to-TSV coupling is a new parasitic element in 3D ICs and can become a significant source of signal integrity problem. Existing studies on its extraction, however, becomes highly inaccurate when handling more than two TSVs on full-chip scale. In this paper we investigate the multiple TSV-to-TSV coupling issue and propose an accurate model that can be efficiently used for full-chip extraction. Unlike the common belief that only the closest neighboring TSVs affect the victim, our study shows that non-neighboring aggressors also cause non-negligible impact. Based on this observation, we propose an effective method of reducing the overall coupling level in multiple TSV cases.

Original languageEnglish
Title of host publicationProceedings of the 50th Annual Design Automation Conference, DAC 2013
DOIs
StatePublished - 2013
Event50th Annual Design Automation Conference, DAC 2013 - Austin, TX, United States
Duration: 29 May 20137 Jun 2013

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference50th Annual Design Automation Conference, DAC 2013
Country/TerritoryUnited States
CityAustin, TX
Period29/05/137/06/13

Keywords

  • 3D IC
  • Coupling
  • TSV
  • TSV-to-TSV coupling

Fingerprint

Dive into the research topics of 'Full-chip multiple TSV-to-TSV coupling extraction and optimization in 3D ICs'. Together they form a unique fingerprint.

Cite this