Full-chip TSV-to-TSV coupling analysis and optimization in 3D IC

Chang Liu, Taigon Song, Jonghyun Cho, Joohee Kim, Joungho Kim, Sung Kyu Lim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

93 Scopus citations

Abstract

This paper studies TSV-to-TSV coupling in 3D ICs. A full-chip SI analysis flow is proposed based on the proposed coupling model. Analysis results show that TSVs cause significant coupling noise and timing problems despite that TSV count is much smaller com- pared with the gate count. Two approaches are proposed to alleviate TSV-to-TSV coupling, namely TSV shielding and buffer insertion. Analysis results show that both approaches are effective in reducing the TSV-caused-coupling and improving timing.

Original languageEnglish
Title of host publication2011 48th ACM/EDAC/IEEE Design Automation Conference, DAC 2011
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages783-788
Number of pages6
ISBN (Print)9781450306362
DOIs
StatePublished - 2011

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Keywords

  • 3D IC
  • TSV-to-TSV coupling

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