Abstract
SnO 2 thin film with homogeneously dispersed nano-crystallite Pt particles was reliably prepared via simple thermal oxidation of a Sn/Pt double layer on Si substrate oxidized. Its surface phase and morphology were probed using some surface sensitive tools such as X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM). The electrical response of SnO 2 thin films to the i-C 4H 10 gas was systematically investigated at a wide range of temperatures and gas concentrations. In particular, a long-term stability test of the fabricated Pt/SnO 2 thin films for the i-C 4H 10 gas proved its applicability as a reliable gas sensor because of its higher sensing stability than the conventional Pt/SnO 2 films over a long period of run time.
| Original language | English |
|---|---|
| Pages (from-to) | 176-181 |
| Number of pages | 6 |
| Journal | Sensors and Actuators, B: Chemical |
| Volume | 81 |
| Issue number | 2-3 |
| DOIs | |
| State | Published - 5 Jan 2002 |
Keywords
- Double layer
- Long-term stability
- SnO
- Thermal oxidation
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