Graphical Patterning-Platform of Software Malfunction for Power Profile-based Side-Channel Analysis

Hyeongrae Kim, Jeonghun Cho, Daejin Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recently, many defects that are not detected in a software system have been found. This flaw is dangerous because the system cannot detect it even if it is attacked by a fault. To detect these defects, we have focused on the unique characteristic of the software system, the power consumption pattern. By comparing this unique normal operation pattern with the realtime operation pattern, we thought that we could fully detect the malfunction. This paper proposes 2-dimension graphical string patterning platform and matcher using side-channel analysis (SCA). We designed the monitoring block which is composed of matcher and pattern generator using Chipwhisperer that is open-source platform for SCA. The patterns are generated in run-time and compared with normal operation pattern. By this proposed method, we were enable to detect malfunction in runtime.

Original languageEnglish
Title of host publication2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728132792
DOIs
StatePublished - May 2019
Event6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019 - Yilan, Taiwan, Province of China
Duration: 20 May 201922 May 2019

Publication series

Name2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019

Conference

Conference6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
Country/TerritoryTaiwan, Province of China
CityYilan
Period20/05/1922/05/19

Keywords

  • pattern-matching
  • Power consumption profile
  • side-channel analysis

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