High-frequency components of leakage current as diagnostic tool to study aging of polymer insulators under salt fog

Y. C. Song; D. H. Choi

doi:10.1049/el:20050516

High-frequency components of leakage current as diagnostic tool to study aging of polymer insulators under salt fog

Y. C. Song, D. H. Choi

School of Electronics Engineering

Kyungpook National University

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

The results of using the high-frequency components of the leakage current to study aging of contaminated insulators under salt fog conditions. Experimental results demonstrate that the high-frequency components can be used effectively to study aging of polymer insulators in a salt fog test.

Original language	English
Pages (from-to)	684-685
Number of pages	2
Journal	Electronics Letters
Volume	41
Issue number	12
DOIs	https://doi.org/10.1049/el:20050516
State	Published - 9 Jun 2005

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title = "High-frequency components of leakage current as diagnostic tool to study aging of polymer insulators under salt fog",

abstract = "The results of using the high-frequency components of the leakage current to study aging of contaminated insulators under salt fog conditions. Experimental results demonstrate that the high-frequency components can be used effectively to study aging of polymer insulators in a salt fog test.",

author = "Song, \{Y. C.\} and Choi, \{D. H.\}",

year = "2005",

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AU - Choi, D. H.

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N2 - The results of using the high-frequency components of the leakage current to study aging of contaminated insulators under salt fog conditions. Experimental results demonstrate that the high-frequency components can be used effectively to study aging of polymer insulators in a salt fog test.

AB - The results of using the high-frequency components of the leakage current to study aging of contaminated insulators under salt fog conditions. Experimental results demonstrate that the high-frequency components can be used effectively to study aging of polymer insulators in a salt fog test.

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DO - 10.1049/el:20050516

M3 - Article

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SP - 684

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JO - Electronics Letters

JF - Electronics Letters

IS - 12

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High-frequency components of leakage current as diagnostic tool to study aging of polymer insulators under salt fog

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