High performance InP mHEMTs on GaAs substrate with multiple interconnect layers

Wonill Ha, Zach Griffith, Dae Hyun Kim, Peter Chen, Miguel Urteaga, Bobby Brar

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

We report the development of high performance metamorphic InP high electron mobility transistors (mHEMTs) with InAs composite channel design and three interconnect metal layers suitable for advanced RF and mixed signal integrated circuits. An un-passivated 35nm Lg device showed RF figures-of-merit of 533 GHz fτ and 343 GHz fmax. After full circuit processing, encapsulated in BCB, a 35nm Lg, 2x20um Wg mHEMT showed 387GHz fτ, 580GHz fmax. Four-inch wafer mapping shows excellent device uniformity and yield. We also report a broadband (206-294GHz) 3-stage G-, H-band common-source amplifier having a nominal S21 mid-band gain of 11-16dB employing thin-film microstrip wiring.

Original languageEnglish
Title of host publication2010 International Conference on Indium Phosphide and Related Materials, 22nd IPRM - Conference Proceedings
Pages140-143
Number of pages4
DOIs
StatePublished - 2010
Event22nd International Conference on Indium Phosphide and Related Materials, IPRM 2010 - Kagawa, Japan
Duration: 31 May 20104 Jun 2010

Publication series

NameConference Proceedings - International Conference on Indium Phosphide and Related Materials
ISSN (Print)1092-8669

Conference

Conference22nd International Conference on Indium Phosphide and Related Materials, IPRM 2010
Country/TerritoryJapan
CityKagawa
Period31/05/104/06/10

Keywords

  • D-mode transistor
  • E-mode transistor
  • Feedback amplifier
  • InP high electron mobility transistor
  • Metamorphic low loss dielectric layer
  • Mutiple interconnect layer

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