Skip to main navigation Skip to search Skip to main content

Impact of process-dependent SiNx passivation on proton-induced degradation in GaN MIS-HEMTs

  • Young Jun Yoon
  • , Jae Sang Lee
  • , In Man Kang
  • , Eun Je Lee
  • , Dong Seok Kim
  • Korea Atomic Energy Research Institute

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Impact of process-dependent SiNx passivation on proton-induced degradation in GaN MIS-HEMTs'. Together they form a unique fingerprint.
Sort by

Material Science