Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment

Junhao Feng, Sang Hwa Jeon, Jaehoon Park, Sin Hyung Lee, Jaewon Jang, In Man Kang, Do Kyung Kim, Jin Hyuk Bae

Research output: Contribution to journal › Article › peer-review

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Material Science

Engineering