TY - GEN
T1 - Improving Performance and Lifetime of Large-Page NAND Storages Using Erase-Free Subpage Programming
AU - Kim, Myungsuk
AU - Lee, Jaehoon
AU - Lee, Sungjin
AU - Park, Jisung
AU - Kim, Jihong
N1 - Publisher Copyright:
© 2017 ACM.
PY - 2017/6/18
Y1 - 2017/6/18
N2 - Recent NAND flash devices have large page sizes. Although large pages are useful in increasing the flash capacity, they can degrade both the performance and lifetime of flash storage systems when small writes are dominant. We propose a new NAND programming scheme, called erase-free sub-page programming (ESP), which allows the same page to be programmed multiple times for small writes. By avoiding internal fragmentation, the ESP scheme reduces the overhead of garbage collection for large-page NAND storages. Experimental results show that an ESP-aware FTL can improve the IOPS and lifetime by up to 74% and 177%, respectively.
AB - Recent NAND flash devices have large page sizes. Although large pages are useful in increasing the flash capacity, they can degrade both the performance and lifetime of flash storage systems when small writes are dominant. We propose a new NAND programming scheme, called erase-free sub-page programming (ESP), which allows the same page to be programmed multiple times for small writes. By avoiding internal fragmentation, the ESP scheme reduces the overhead of garbage collection for large-page NAND storages. Experimental results show that an ESP-aware FTL can improve the IOPS and lifetime by up to 74% and 177%, respectively.
UR - http://www.scopus.com/inward/record.url?scp=85023608989&partnerID=8YFLogxK
U2 - 10.1145/3061639.3062264
DO - 10.1145/3061639.3062264
M3 - Conference contribution
AN - SCOPUS:85023608989
T3 - Proceedings - Design Automation Conference
BT - Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 54th Annual Design Automation Conference, DAC 2017
Y2 - 18 June 2017 through 22 June 2017
ER -