In situ characterization of the field-emission behaviour of individual carbon nanotubes

Chang Duk Kim; Hoon Sik Jang; Sung Youp Lee; Hyeong Rag Lee; Yong Suk Roh; Il Su Rhee; Eui Wan Lee; Hee Sun Yang; Do Hyung Kim

doi:10.1088/0957-4484/17/20/023

In situ characterization of the field-emission behaviour of individual carbon nanotubes

Chang Duk Kim, Hoon Sik Jang, Sung Youp Lee, Hyeong Rag Lee, Yong Suk Roh, Il Su Rhee, Eui Wan Lee, Hee Sun Yang, Do Hyung Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

The current-voltage (I-V) characteristics of carbon nanotubes (CNTs) during field emission were investigated by insitu imaging and field-emission (FE) measurement inside a field-emission scanning electron microscope (FE-SEM). A primary electron of the FE-SEM could induce and enhance a large stimulated electron emission from a CNT which might be due to the strong local field on the tip of the CNT in the presence of an applied voltage. FE of bent nanotubes (BNTs) can initially occur after they are fully straightened or it can start in the bent state (during geometrical straightening) as the applied field increases. The FE from a single CNT follows FN (Fowler-Nordheim) behaviour with a single linear slope in the FN plot. The FE from two nanotubes with a geometrical change during FE showed transition of the FN slope from the low voltage to the high voltage region, which could be due to interactions between two dynamic neighbouring BNTs.

Original language	English
Article number	023
Pages (from-to)	5180-5184
Number of pages	5
Journal	Nanotechnology
Volume	17
Issue number	20
DOIs	https://doi.org/10.1088/0957-4484/17/20/023
State	Published - 28 Oct 2006

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title = "In situ characterization of the field-emission behaviour of individual carbon nanotubes",

abstract = "The current-voltage (I-V) characteristics of carbon nanotubes (CNTs) during field emission were investigated by insitu imaging and field-emission (FE) measurement inside a field-emission scanning electron microscope (FE-SEM). A primary electron of the FE-SEM could induce and enhance a large stimulated electron emission from a CNT which might be due to the strong local field on the tip of the CNT in the presence of an applied voltage. FE of bent nanotubes (BNTs) can initially occur after they are fully straightened or it can start in the bent state (during geometrical straightening) as the applied field increases. The FE from a single CNT follows FN (Fowler-Nordheim) behaviour with a single linear slope in the FN plot. The FE from two nanotubes with a geometrical change during FE showed transition of the FN slope from the low voltage to the high voltage region, which could be due to interactions between two dynamic neighbouring BNTs.",

author = "Kim, {Chang Duk} and Jang, {Hoon Sik} and Lee, {Sung Youp} and Lee, {Hyeong Rag} and Roh, {Yong Suk} and Rhee, {Il Su} and Lee, {Eui Wan} and Yang, {Hee Sun} and Kim, {Do Hyung}",

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AU - Kim, Chang Duk

AU - Jang, Hoon Sik

AU - Lee, Sung Youp

AU - Lee, Hyeong Rag

AU - Roh, Yong Suk

AU - Rhee, Il Su

AU - Lee, Eui Wan

AU - Yang, Hee Sun

AU - Kim, Do Hyung

PY - 2006/10/28

Y1 - 2006/10/28

N2 - The current-voltage (I-V) characteristics of carbon nanotubes (CNTs) during field emission were investigated by insitu imaging and field-emission (FE) measurement inside a field-emission scanning electron microscope (FE-SEM). A primary electron of the FE-SEM could induce and enhance a large stimulated electron emission from a CNT which might be due to the strong local field on the tip of the CNT in the presence of an applied voltage. FE of bent nanotubes (BNTs) can initially occur after they are fully straightened or it can start in the bent state (during geometrical straightening) as the applied field increases. The FE from a single CNT follows FN (Fowler-Nordheim) behaviour with a single linear slope in the FN plot. The FE from two nanotubes with a geometrical change during FE showed transition of the FN slope from the low voltage to the high voltage region, which could be due to interactions between two dynamic neighbouring BNTs.

AB - The current-voltage (I-V) characteristics of carbon nanotubes (CNTs) during field emission were investigated by insitu imaging and field-emission (FE) measurement inside a field-emission scanning electron microscope (FE-SEM). A primary electron of the FE-SEM could induce and enhance a large stimulated electron emission from a CNT which might be due to the strong local field on the tip of the CNT in the presence of an applied voltage. FE of bent nanotubes (BNTs) can initially occur after they are fully straightened or it can start in the bent state (during geometrical straightening) as the applied field increases. The FE from a single CNT follows FN (Fowler-Nordheim) behaviour with a single linear slope in the FN plot. The FE from two nanotubes with a geometrical change during FE showed transition of the FN slope from the low voltage to the high voltage region, which could be due to interactions between two dynamic neighbouring BNTs.

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In situ characterization of the field-emission behaviour of individual carbon nanotubes

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