In-situ measurement of stress and ion dynamics in conducting polymers

S. Sen, S. Y. Kim, S. Jin, L. R. Palmore, N. Jadhav, E. Chason, G. T.R. Palmore

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Voltage-induced ion motion in conducting polymers (CPs) and the associated stress that evolves play an important role in determining the performance and lifetime of devices fabricated from these materials. In this work, a multi-beam optical stress sensor (MOSS) coupled with potential cycling was used to study films of polypyrrole (pPy) doped with indigo carmine (IC), a redox-active anion. We observe different magnitudes of stress in these films in different electrolytes (NaCl vs. HCl) due to the pH-dependent redox activity of IC. These results indicate that the redox activity of a dopant introduces an additional mode by which stress develops in films of CPs, which in turn could impact device performance.

Original languageEnglish
Title of host publicationStress-Related Phenomena in Electrochemical Systems 2
PublisherElectrochemical Society Inc.
Pages15-21
Number of pages7
Edition22
ISBN (Electronic)9781623320416
ISBN (Print)9781623320416
DOIs
StatePublished - 2012
EventSymposium on Stress-Related Phenomena in Electrochemical Systems 2 - 221st ECS Meeting - Seattle, WA, United States
Duration: 6 May 201210 May 2012

Publication series

NameECS Transactions
Number22
Volume45
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceSymposium on Stress-Related Phenomena in Electrochemical Systems 2 - 221st ECS Meeting
Country/TerritoryUnited States
CitySeattle, WA
Period6/05/1210/05/12

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