Integrated reflectometer-interferometer system for plasma density profile measurement

Experimental results are described from an integrated interferometer-reflectometer system implemented on TEXT-Upgrade. In plasma regions where the systems have spatial overlap, excellent agreement is observed between the independently measured electron density profiles. Combined interferometer-reflectometer data are used to obtain the optimal total density profile. By removing chords from the interferometer, one can examine how resolution is compromised as the channel number decreases and spacing varies. Depending on the expected profile shapes (i.e. flat or peaked), one can design an integrated interferometer-reflectometer system employing a minimum number of chords while still providing crucial profile information.