@inproceedings{ef5104396d4248f1b90345736034668e,
title = "Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence",
abstract = "A CMOS process-compatible DNA-FRET/REFET/quasi-reference electrode (QRE) which is able to replace the conventional Ag/AgCl RE for the detection of DNA sequence was proposed. Au and Pt were used as the gate metal of DNA-FET and REFET, respectively, for the selective detection of thiol. The individual and differential measurements of the DNA-FRET/REFET/QRE for a single-stranded DNA with thiol and a target-DNA detection were performed. The results show that the DNA-FET and REFET can perform the selective detection of DNA immobilization and hybridization.",
author = "Kim, {Dong Sun} and Han, {Dae Il} and Park, {Jee Eun} and Shin, {Jang Kyoo} and Kong, {Seong Ho} and Pyung Choi and Minho Lee and Kim, {Sang Hyo} and Geunbae Lim",
year = "2004",
language = "English",
isbn = "4990247205",
series = "Digest of Papers - Microprocesses and Nanotechnology 2004",
pages = "240--241",
booktitle = "Digest of Papers - Microprocesses and Nanotechnology 2004",
note = "2004 International Microprocesses and Nanotechnology Conference ; Conference date: 26-10-2004 Through 29-10-2004",
}