Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence

Dong Sun Kim, Dae Il Han, Jee Eun Park, Jang Kyoo Shin, Seong Ho Kong, Pyung Choi, Minho Lee, Sang Hyo Kim, Geunbae Lim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

A CMOS process-compatible DNA-FRET/REFET/quasi-reference electrode (QRE) which is able to replace the conventional Ag/AgCl RE for the detection of DNA sequence was proposed. Au and Pt were used as the gate metal of DNA-FET and REFET, respectively, for the selective detection of thiol. The individual and differential measurements of the DNA-FRET/REFET/QRE for a single-stranded DNA with thiol and a target-DNA detection were performed. The results show that the DNA-FET and REFET can perform the selective detection of DNA immobilization and hybridization.

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 2004
Pages240-241
Number of pages2
StatePublished - 2004
Event2004 International Microprocesses and Nanotechnology Conference - Osaka, Japan
Duration: 26 Oct 200429 Oct 2004

Publication series

NameDigest of Papers - Microprocesses and Nanotechnology 2004

Conference

Conference2004 International Microprocesses and Nanotechnology Conference
Country/TerritoryJapan
CityOsaka
Period26/10/0429/10/04

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