Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence

Dong Sun Kim; Dae Il Han; Jee Eun Park; Jang Kyoo Shin; Seong Ho Kong; Pyung Choi; Minho Lee; Sang Hyo Kim; Geunbae Lim

Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence

Dong Sun Kim
, Dae Il Han
, Jee Eun Park
, Jang Kyoo Shin
, Seong Ho Kong
, Pyung Choi
, Minho Lee
, Sang Hyo Kim
, Geunbae Lim

School of Electronics Engineering

Kyungpook National University
Samsung
Pohang University of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

A CMOS process-compatible DNA-FRET/REFET/quasi-reference electrode (QRE) which is able to replace the conventional Ag/AgCl RE for the detection of DNA sequence was proposed. Au and Pt were used as the gate metal of DNA-FET and REFET, respectively, for the selective detection of thiol. The individual and differential measurements of the DNA-FRET/REFET/QRE for a single-stranded DNA with thiol and a target-DNA detection were performed. The results show that the DNA-FET and REFET can perform the selective detection of DNA immobilization and hybridization.

Original language	English
Title of host publication	Digest of Papers - Microprocesses and Nanotechnology 2004
Pages	240-241
Number of pages	2
State	Published - 2004
Event	2004 International Microprocesses and Nanotechnology Conference - Osaka, Japan Duration: 26 Oct 2004 → 29 Oct 2004

Publication series

Name	Digest of Papers - Microprocesses and Nanotechnology 2004

Conference

Conference	2004 International Microprocesses and Nanotechnology Conference
Country/Territory	Japan
City	Osaka
Period	26/10/04 → 29/10/04

Cite this

@inproceedings{ef5104396d4248f1b90345736034668e,

title = "Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence",

abstract = "A CMOS process-compatible DNA-FRET/REFET/quasi-reference electrode (QRE) which is able to replace the conventional Ag/AgCl RE for the detection of DNA sequence was proposed. Au and Pt were used as the gate metal of DNA-FET and REFET, respectively, for the selective detection of thiol. The individual and differential measurements of the DNA-FRET/REFET/QRE for a single-stranded DNA with thiol and a target-DNA detection were performed. The results show that the DNA-FET and REFET can perform the selective detection of DNA immobilization and hybridization.",

author = "Kim, \{Dong Sun\} and Han, \{Dae Il\} and Park, \{Jee Eun\} and Shin, \{Jang Kyoo\} and Kong, \{Seong Ho\} and Pyung Choi and Minho Lee and Kim, \{Sang Hyo\} and Geunbae Lim",

year = "2004",

language = "English",

isbn = "4990247205",

series = "Digest of Papers - Microprocesses and Nanotechnology 2004",

pages = "240--241",

booktitle = "Digest of Papers - Microprocesses and Nanotechnology 2004",

note = "2004 International Microprocesses and Nanotechnology Conference ; Conference date: 26-10-2004 Through 29-10-2004",

}

Kim, DS, Han, DI, Park, JE, Shin, JK, Kong, SH, Choi, P, Lee, M, Kim, SH & Lim, G 2004, Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence. in Digest of Papers - Microprocesses and Nanotechnology 2004. Digest of Papers - Microprocesses and Nanotechnology 2004, pp. 240-241, 2004 International Microprocesses and Nanotechnology Conference, Osaka, Japan, 26/10/04.

Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence. / Kim, Dong Sun; Han, Dae Il; Park, Jee Eun et al.
Digest of Papers - Microprocesses and Nanotechnology 2004. 2004. p. 240-241 (Digest of Papers - Microprocesses and Nanotechnology 2004).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence

AU - Kim, Dong Sun

AU - Han, Dae Il

AU - Park, Jee Eun

AU - Shin, Jang Kyoo

AU - Kong, Seong Ho

AU - Choi, Pyung

AU - Lee, Minho

AU - Kim, Sang Hyo

AU - Lim, Geunbae

PY - 2004

Y1 - 2004

N2 - A CMOS process-compatible DNA-FRET/REFET/quasi-reference electrode (QRE) which is able to replace the conventional Ag/AgCl RE for the detection of DNA sequence was proposed. Au and Pt were used as the gate metal of DNA-FET and REFET, respectively, for the selective detection of thiol. The individual and differential measurements of the DNA-FRET/REFET/QRE for a single-stranded DNA with thiol and a target-DNA detection were performed. The results show that the DNA-FET and REFET can perform the selective detection of DNA immobilization and hybridization.

AB - A CMOS process-compatible DNA-FRET/REFET/quasi-reference electrode (QRE) which is able to replace the conventional Ag/AgCl RE for the detection of DNA sequence was proposed. Au and Pt were used as the gate metal of DNA-FET and REFET, respectively, for the selective detection of thiol. The individual and differential measurements of the DNA-FRET/REFET/QRE for a single-stranded DNA with thiol and a target-DNA detection were performed. The results show that the DNA-FET and REFET can perform the selective detection of DNA immobilization and hybridization.

UR - https://www.scopus.com/pages/publications/23244440015

M3 - Conference contribution

AN - SCOPUS:23244440015

SN - 4990247205

T3 - Digest of Papers - Microprocesses and Nanotechnology 2004

SP - 240

EP - 241

BT - Digest of Papers - Microprocesses and Nanotechnology 2004

T2 - 2004 International Microprocesses and Nanotechnology Conference

Y2 - 26 October 2004 through 29 October 2004

ER -

Integration of CMOS process-compatible DNA-FET/REFET/QRE for the detection of DNA sequence

Abstract

Publication series

Conference

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