Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques

Tae Sik Cho; Min Su Yi; Seok Joo Doh; Jung Ho Je; Do Young Noh

doi:10.1002/pssb.200304518

Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques

Tae Sik Cho, Min Su Yi, Seok Joo Doh, Jung Ho Je, Do Young Noh

Department of Nano & Advanced Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron X-ray techniques, such as X-ray reflectivity, extended X-ray absorption fine structures (EXAFS), and high-resolution X-ray scattering. The results of X-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increases with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The results of high-resolution X-ray scattering supported the interfacial diffusion of Fe atoms. Our study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.

Original language	English
Pages (from-to)	1748-1751
Number of pages	4
Journal	Physica Status Solidi (B): Basic Research
Volume	241
Issue number	7
DOIs	https://doi.org/10.1002/pssb.200304518
State	Published - Jun 2004

Access to Document

10.1002/pssb.200304518

Cite this

@article{8841a3303b3c47d3b4088085ff006ee7,

title = "Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques",

abstract = "We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron X-ray techniques, such as X-ray reflectivity, extended X-ray absorption fine structures (EXAFS), and high-resolution X-ray scattering. The results of X-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increases with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The results of high-resolution X-ray scattering supported the interfacial diffusion of Fe atoms. Our study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.",

author = "Cho, {Tae Sik} and Yi, {Min Su} and Doh, {Seok Joo} and Je, {Jung Ho} and Noh, {Do Young}",

year = "2004",

month = jun,

doi = "10.1002/pssb.200304518",

language = "English",

volume = "241",

pages = "1748--1751",

journal = "Physica Status Solidi (B): Basic Research",

issn = "0370-1972",

publisher = "Wiley-VCH Verlag",

number = "7",

}

TY - JOUR

T1 - Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques

AU - Cho, Tae Sik

AU - Yi, Min Su

AU - Doh, Seok Joo

AU - Je, Jung Ho

AU - Noh, Do Young

PY - 2004/6

Y1 - 2004/6

N2 - We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron X-ray techniques, such as X-ray reflectivity, extended X-ray absorption fine structures (EXAFS), and high-resolution X-ray scattering. The results of X-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increases with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The results of high-resolution X-ray scattering supported the interfacial diffusion of Fe atoms. Our study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.

AB - We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron X-ray techniques, such as X-ray reflectivity, extended X-ray absorption fine structures (EXAFS), and high-resolution X-ray scattering. The results of X-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increases with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The results of high-resolution X-ray scattering supported the interfacial diffusion of Fe atoms. Our study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.

UR - http://www.scopus.com/inward/record.url?scp=4644263360&partnerID=8YFLogxK

U2 - 10.1002/pssb.200304518

DO - 10.1002/pssb.200304518

M3 - Article

AN - SCOPUS:4644263360

SN - 0370-1972

VL - 241

SP - 1748

EP - 1751

JO - Physica Status Solidi (B): Basic Research

JF - Physica Status Solidi (B): Basic Research

IS - 7

ER -

Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques

Abstract

Access to Document

Other files and links

Fingerprint

Cite this