Internal resistor of multi-functional tunnel barrier for selectivity and switching uniformity in resistive random access memory

Sangheon Lee, Jiyong Woo, Daeseok Lee, Euijun Cha, Hyunsang Hwang

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

In this research, we analyzed the multi-functional role of a tunnel barrier that can be integrated in devices. This tunnel barrier, acting as an internal resistor, changes its resistance with applied bias. Therefore, the current flow in the devices can be controlled by a tunneling mechanism that modifies the tunnel barrier thickness for non-linearity and switching uniformity of devices. When a device is in a low-resistance state, the tunnel barrier controls the current behavior of the device because most of the bias is applied to the tunnel barrier owing to its higher resistance. Furthermore, the tunnel barrier induces uniform filament formation during set operation with the tunnel barrier controlling the current flow.

Original languageEnglish
Article number364
Pages (from-to)1-7
Number of pages7
JournalNanoscale Research Letters
Volume9
Issue number1
DOIs
StatePublished - 2014

Keywords

  • Reliability
  • ReRAM
  • Selectivity

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