Abstract
Undoped, Zn-doped, Mg-doped GaN thin film were prepared on sapphire substrate by MOCVD. SAW velocity was measured with the center frequency by HP8753C. Mg-doped GaN has the highest SAW velocity of 5617 m/s at kh=0.157 and undoped GaN has the lowest SAW velocity of 5400 m/s at kh=0.188. TCF is - 60.8 ppm/°C for undoped GaN, -46.8 ppm/°C for Zn-doped GaN and -18.3 ppm/°C for Mg-doped GaN, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 207-209 |
| Number of pages | 3 |
| Journal | Proceedings of the IEEE Ultrasonics Symposium |
| Volume | 1 |
| DOIs | |
| State | Published - 2001 |
Keywords
- Mg-doped GaN
- MOCVD
- SAW filter
- Zn-doped GaN
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