Investigation of dopant dependent wave velocity in GaN thin film SAW filter

  • Hwan Hee Jeong
  • , Sun Ki Kim
  • , Jae Sung Lee
  • , Hyun Chul Choi
  • , Jung Hee Lee
  • , Yong Hyun Lee

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Undoped, Zn-doped, Mg-doped GaN thin film were prepared on sapphire substrate by MOCVD. SAW velocity was measured with the center frequency by HP8753C. Mg-doped GaN has the highest SAW velocity of 5617 m/s at kh=0.157 and undoped GaN has the lowest SAW velocity of 5400 m/s at kh=0.188. TCF is - 60.8 ppm/°C for undoped GaN, -46.8 ppm/°C for Zn-doped GaN and -18.3 ppm/°C for Mg-doped GaN, respectively.

Original languageEnglish
Pages (from-to)207-209
Number of pages3
JournalProceedings of the IEEE Ultrasonics Symposium
Volume1
DOIs
StatePublished - 2001

Keywords

  • Mg-doped GaN
  • MOCVD
  • SAW filter
  • Zn-doped GaN

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