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Investigation of electrical characteristics of flexible CMOS devices fabricated with thickness-controlled spalling process
Honghwi Park, Changhee Lim, Yeho Noh, Chang Ju Lee, Heungsup Won, Jaedong Jung, Muhan Choi, Jae Joon Kim, Hocheon Yoo, Hongsik Park
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations