Abstract
On the basis of scanning thermal microscopy (SThM) measurements in contact and lift modes, the low-frequency acoustic phonon temperature in electrically biased, 6.7 - 9.7 μm long graphene channels is found to be in equilibrium with the anharmonic scattering temperature determined from the Raman 2D peak position. With ∼100 nm scale spatial resolution, the SThM reveals the shifting of local hot spots corresponding to low-carrier concentration regions with the bias and gate voltages in these much shorter samples than those exhibiting similar behaviors in the infrared emission maps.
| Original language | English |
|---|---|
| Pages (from-to) | 85-90 |
| Number of pages | 6 |
| Journal | Nano Letters |
| Volume | 11 |
| Issue number | 1 |
| DOIs | |
| State | Published - 12 Jan 2011 |
Keywords
- Acoustic phonons
- Electrical heating
- Graphene
- Raman spectroscopy
- Scanning thermal microscopy
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