Low-temperature characteristics of In0.7Ga0.3As PHEMTs

  • Seung Woo Son
  • , Jung Ho Park
  • , Ji Min Baek
  • , Jin Su Kim
  • , Do Kywn Kim
  • , Dae Hyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

In this paper, we report on temperature dependent DC characteristics of In0.7Ga0.3As Pseudomorphic-HEMTs (PHEMTs) on InP substrate. First, we have fabricated the In0.7Ga0.3As PHEMTs with various values of Lg, ranging from 10 μm to 2.5 μm. The fabricated device with Lg = 2.5 μm exhibits excellent subthreshold-swing (SS) of 64 mV/decade at room temperature. Note that this is close to 60 mV/decade, which is a theoretical limit at room temperature in a FET configuration. Next, we have measured current-voltage characteristics at various values of temperatures, from 300 K to 80 K. Finally, we have investigated the temperature-dependent DC characteristics of the In0.7Ga0.3As PHEMTs, in terms of output, subthreshold, and transconductance characteristics.

Original languageEnglish
Title of host publicationProceedings of the 25th Biennial Lester Eastman Conference on High Performance Devices, LEC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages12-14
Number of pages3
ISBN (Electronic)9781467386289
DOIs
StatePublished - 27 Sep 2016
Event25th Biennial Lester Eastman Conference on High Performance Devices, LEC 2016 - Bethlehem, United States
Duration: 2 Aug 20164 Aug 2016

Publication series

NameProceedings of the 25th Biennial Lester Eastman Conference on High Performance Devices, LEC 2016

Conference

Conference25th Biennial Lester Eastman Conference on High Performance Devices, LEC 2016
Country/TerritoryUnited States
CityBethlehem
Period2/08/164/08/16

Keywords

  • III-V
  • InGaAs
  • Low-Temperature
  • PHEMT

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