Material engineering to enhance reliability in 3D NAND flash memory
- Ki Han Kim
- , Namju Kim
- , Yeong Kwon Kim
- , Hee Seung Kim
- , Han Byeol Oh
- , Chae Eun Kim
- , Hyeun Woo Shin
- , Myeong Gi Kim
- , Won Jun Choi
- , Byung Chul Jang
- Kyungpook National University
Research output: Contribution to journal › Review article › peer-review
14
Scopus
citations