TY - JOUR
T1 - Measurement of all the elastic and dielectric constants of poled PVDF films
AU - Varadan, V. V.
AU - Roh, Y. R.
AU - Varadan, V. K.
AU - Tancrell, R. H.
PY - 1989
Y1 - 1989
N2 - As opposed to conventional piezoceramics, PVDF is a piezoelectric material, in polymer form. However, its properties are not well characterized due to the availability of poled PVDF only as a thin film. In the design of piezoelectric devices, properties such as all the components of the elastic stiffness tensor, dielectric tensor, and the electromechanical coupling tensor are needed. Poled PVDF is of mm2 symmetry. The frequency dependences of all nine complex elastic constants as well as the three complex dielectric constants were measured using a thin film and stacked, cubical samples of PVDF film. The elastic constants CD44 and CD55 as well as the dielectric constant εT11 and εT22 reported here are new. Ultrasonic measurements and an impedance analyzer were used to obtain the measured data.
AB - As opposed to conventional piezoceramics, PVDF is a piezoelectric material, in polymer form. However, its properties are not well characterized due to the availability of poled PVDF only as a thin film. In the design of piezoelectric devices, properties such as all the components of the elastic stiffness tensor, dielectric tensor, and the electromechanical coupling tensor are needed. Poled PVDF is of mm2 symmetry. The frequency dependences of all nine complex elastic constants as well as the three complex dielectric constants were measured using a thin film and stacked, cubical samples of PVDF film. The elastic constants CD44 and CD55 as well as the dielectric constant εT11 and εT22 reported here are new. Ultrasonic measurements and an impedance analyzer were used to obtain the measured data.
UR - http://www.scopus.com/inward/record.url?scp=0024897186&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0024897186
SN - 0090-5607
VL - 2
SP - 727
EP - 730
JO - Ultrasonics Symposium Proceedings
JF - Ultrasonics Symposium Proceedings
T2 - IEEE 1989 Ultrasonics Symposium
Y2 - 3 October 1989 through 6 October 1989
ER -