Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

Sunjeong Park; Hyun Woo Kim; Mi Hye Kim; Young Chan Kim; In Hyung Baek; Kyu Ha Jang; Eun San Kim; Hongjoo Kim; Nikolay A. Vinokurov; Young Uk Jeong; Seong Hee Park

doi:10.1016/j.nima.2019.01.087

Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

Sunjeong Park, Hyun Woo Kim, Mi Hye Kim, Young Chan Kim, In Hyung Baek, Kyu Ha Jang, Eun San Kim, Hongjoo Kim, Nikolay A. Vinokurov, Young Uk Jeong, Seong Hee Park

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump–probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on TM ₁₂₀ mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.

Original language	English
Pages (from-to)	194-201
Number of pages	8
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	927
DOIs	https://doi.org/10.1016/j.nima.2019.01.087
State	Published - 21 May 2019

Keywords

Electron duration measurement
RF deflector
Ultrafast electron diffraction system
Ultrashort bunch measurement

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10.1016/j.nima.2019.01.087

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Park, S., Kim, H. W., Kim, M. H., Kim, Y. C., Baek, I. H., Jang, K. H., Kim, E. S., Kim, H., Vinokurov, N. A., Jeong, Y. U., & Park, S. H. (2019). Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 927, 194-201. https://doi.org/10.1016/j.nima.2019.01.087

@article{49a544fd90524742804ecb8e199c82bf,

title = "Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector",

abstract = " Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump–probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on TM 120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.",

keywords = "Electron duration measurement, RF deflector, Ultrafast electron diffraction system, Ultrashort bunch measurement",

author = "Sunjeong Park and Kim, \{Hyun Woo\} and Kim, \{Mi Hye\} and Kim, \{Young Chan\} and Baek, \{In Hyung\} and Jang, \{Kyu Ha\} and Kim, \{Eun San\} and Hongjoo Kim and Vinokurov, \{Nikolay A.\} and Jeong, \{Young Uk\} and Park, \{Seong Hee\}",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier B.V.",

year = "2019",

month = may,

day = "21",

doi = "10.1016/j.nima.2019.01.087",

language = "English",

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Park, S, Kim, HW, Kim, MH, Kim, YC, Baek, IH, Jang, KH, Kim, ES, Kim, H, Vinokurov, NA, Jeong, YU & Park, SH 2019, 'Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 927, pp. 194-201. https://doi.org/10.1016/j.nima.2019.01.087

Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector. / Park, Sunjeong; Kim, Hyun Woo; Kim, Mi Hye et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 927, 21.05.2019, p. 194-201.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

AU - Park, Sunjeong

AU - Kim, Hyun Woo

AU - Kim, Mi Hye

AU - Kim, Young Chan

AU - Baek, In Hyung

AU - Jang, Kyu Ha

AU - Kim, Eun San

AU - Kim, Hongjoo

AU - Vinokurov, Nikolay A.

AU - Jeong, Young Uk

AU - Park, Seong Hee

PY - 2019/5/21

Y1 - 2019/5/21

N2 - Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump–probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on TM 120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.

AB - Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump–probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on TM 120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.

KW - Electron duration measurement

KW - RF deflector

KW - Ultrafast electron diffraction system

KW - Ultrashort bunch measurement

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JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ER -

Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

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Keywords

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