Measurement of low-energy and low-charge ultrashort bunches using an S-band RF deflector

Sunjeong Park, Hyun Woo Kim, Mi Hye Kim, Young Chan Kim, In Hyung Baek, Kyu Ha Jang, Eun San Kim, Hongjoo Kim, Nikolay A. Vinokurov, Young Uk Jeong, Seong Hee Park

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Ultrafast Electron Diffraction (UED) system, using an electron bunch of the duration with less than 100 fs and of the energy with 3 MeV, has been developed as a tool probing the ultrafast dynamics in pump–probe experiments. To keep the temporal and transverse characteristics of the electron bunch for the time-resolved electron diffraction, the bunch charge is limited to be the pico-Coulomb or less. S-band transverse deflecting cavity working on TM 120 mode is designed, fabricated, and installed in the UED system to measure directly the fs-scaled pulse duration of low-energy and low-charge electron bunches. We describe the design and the expected performance of a single-cell RF deflector. For the electron beam of 3 MeV in energy and 1.88 pC in charge, we could measure the bunch duration of 69 fs and the timing jitter of 62 fs, both in rms.

Keywords

  • Electron duration measurement
  • RF deflector
  • Ultrafast electron diffraction system
  • Ultrashort bunch measurement

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