Measurement of radiation damage on a back-illuminated silicon PIN photodiode caused by a 35 MeV proton beam

Jae Beom Bae, Hyo Jung Hyun, Dong Ha Kah, Hyun Ok Kim, Hwanbae Park, Myung Hwan Jung, Se Jin Ra

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

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Physics