Abstract
We have obtained work functions for the MgO, MgAl2O4 and MgAl2O4/MgO films using the γ-focused ion beam(γ-FIB) system. The MgAl2O4/MgO protective layer has been found to have lower work function values of 4.25 eV than those for MgO protective layers whose are of 4.54 eV, and MgAl2O4 layer the highest work function values of 4.7eV. It is also found that MgAl 2O4/MgO and MgO protective lavers have been found to have the similar secondary electron emission coefficien (γ) to each other from 0.05 up to 0.08 for Ne+ ion energies ranged from 80 eV to 200eV.
Original language | English |
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Pages | 1177-1180 |
Number of pages | 4 |
State | Published - 2006 |
Event | 13th International Display Workshops, IDW '06 - Otsu, Japan Duration: 6 Dec 2006 → 6 Dec 2006 |
Conference
Conference | 13th International Display Workshops, IDW '06 |
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Country/Territory | Japan |
City | Otsu |
Period | 6/12/06 → 6/12/06 |