Measurement of work function of the MgO, MgAl2O4/MgO and MgAl2O4 protective layer in AC-PDPs

Jung Kang-Won, H. J. Lee, W. H. Jeong, S. J. Jeong, H. J. Oh, C. W. Park, Y. H. Seo, S. O. Kang, E. H. Choi

Research output: Contribution to conferencePaperpeer-review

Abstract

We have obtained work functions for the MgO, MgAl2O4 and MgAl2O4/MgO films using the γ-focused ion beam(γ-FIB) system. The MgAl2O4/MgO protective layer has been found to have lower work function values of 4.25 eV than those for MgO protective layers whose are of 4.54 eV, and MgAl2O4 layer the highest work function values of 4.7eV. It is also found that MgAl 2O4/MgO and MgO protective lavers have been found to have the similar secondary electron emission coefficien (γ) to each other from 0.05 up to 0.08 for Ne+ ion energies ranged from 80 eV to 200eV.

Original languageEnglish
Pages1177-1180
Number of pages4
StatePublished - 2006
Event13th International Display Workshops, IDW '06 - Otsu, Japan
Duration: 6 Dec 20066 Dec 2006

Conference

Conference13th International Display Workshops, IDW '06
Country/TerritoryJapan
CityOtsu
Period6/12/066/12/06

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