Microstructures and electrical properties of (Pb, lа)Тio3 thin films grown on the pt electrodes with a percolating network structure

Don Hee Lee; Jeong Soo Lee; Sung Moon Cho; Hyo Jin Nam; Jue Haeng Lee; Jun Rim Choi; Kwang Young Kim; Sung OKUYAMA Kim; Masanori Okuyama

doi:10.1143/JJAP.34.2453

Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure

Don Hee Lee, Jeong Soo Lee, Sung Moon Cho, Hyo Jin Nam, Jue Haeng Lee, Jun Rim Choi, Kwang Young Kim, Sung OKUYAMA Kim, Masanori Okuyama

School of Electronics Engineering

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

We have investigated the microstructures and electrical properties of Pb_0.95, Lа_0.05ТiO₃ (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm² and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 10⁸ cmformula presented at 10 Hz, respectively, without any poling treatment.

Original language	English
Pages (from-to)	2453-2458
Number of pages	6
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	34
Issue number	5R
DOIs	https://doi.org/10.1143/JJAP.34.2453
State	Published - May 1995

Keywords

C-axis orientation
Infrared sensor
Percolating Pt network
PLT thin film

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10.1143/JJAP.34.2453

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Lee, D. H., Lee, J. S., Cho, S. M., Nam, H. J., Lee, J. H., Choi, J. R., Kim, K. Y., Kim, S. OKUYAMA., & Okuyama, M. (1995). Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 34(5R), 2453-2458. https://doi.org/10.1143/JJAP.34.2453

@article{1d68263b3820474193da07c565e6cda4,

title = "Microstructures and electrical properties of (Pb, lа)Тio3 thin films grown on the pt electrodes with a percolating network structure",

abstract = "We have investigated the microstructures and electrical properties of Pb0.95, Lа0.05ТiO3 (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm2 and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 108 cmformula presented at 10 Hz, respectively, without any poling treatment.",

keywords = "C-axis orientation, Infrared sensor, Percolating Pt network, PLT thin film",

author = "Lee, {Don Hee} and Lee, {Jeong Soo} and Cho, {Sung Moon} and Nam, {Hyo Jin} and Lee, {Jue Haeng} and Choi, {Jun Rim} and Kim, {Kwang Young} and Kim, {Sung OKUYAMA} and Masanori Okuyama",

year = "1995",

month = may,

doi = "10.1143/JJAP.34.2453",

language = "English",

volume = "34",

pages = "2453--2458",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "5R",

}

Lee, DH, Lee, JS, Cho, SM, Nam, HJ, Lee, JH, Choi, JR, Kim, KY, Kim, SOKUYAMA & Okuyama, M 1995, 'Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 34, no. 5R, pp. 2453-2458. https://doi.org/10.1143/JJAP.34.2453

Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure. / Lee, Don Hee; Lee, Jeong Soo; Cho, Sung Moon et al.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 34, No. 5R, 05.1995, p. 2453-2458.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Microstructures and electrical properties of (Pb, lа)Тio3 thin films grown on the pt electrodes with a percolating network structure

AU - Lee, Don Hee

AU - Lee, Jeong Soo

AU - Cho, Sung Moon

AU - Nam, Hyo Jin

AU - Lee, Jue Haeng

AU - Choi, Jun Rim

AU - Kim, Kwang Young

AU - Kim, Sung OKUYAMA

AU - Okuyama, Masanori

PY - 1995/5

Y1 - 1995/5

N2 - We have investigated the microstructures and electrical properties of Pb0.95, Lа0.05ТiO3 (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm2 and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 108 cmformula presented at 10 Hz, respectively, without any poling treatment.

AB - We have investigated the microstructures and electrical properties of Pb0.95, Lа0.05ТiO3 (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm2 and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 108 cmformula presented at 10 Hz, respectively, without any poling treatment.

KW - C-axis orientation

KW - Infrared sensor

KW - Percolating Pt network

KW - PLT thin film

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U2 - 10.1143/JJAP.34.2453

DO - 10.1143/JJAP.34.2453

M3 - Article

AN - SCOPUS:0029308229

SN - 0021-4922

VL - 34

SP - 2453

EP - 2458

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 5R

ER -

Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure

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