Microstructures and electrical properties of (Pb, lа)Тio3 thin films grown on the pt electrodes with a percolating network structure

Don Hee Lee; Jeong Soo Lee; Sung Moon Cho; Hyo Jin Nam; Jue Haeng Lee; Jun Rim Choi; Kwang Young Kim; Sung OKUYAMA Kim; Masanori Okuyama

doi:10.1143/JJAP.34.2453

Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure

Don Hee Lee
, Jeong Soo Lee
, Sung Moon Cho
, Hyo Jin Nam
, Jue Haeng Lee
, Jun Rim Choi
, Kwang Young Kim
, Sung OKUYAMA Kim
, Masanori Okuyama

School of Electronics Engineering

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

We have investigated the microstructures and electrical properties of Pb_0.95, Lа_0.05ТiO₃ (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm² and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 10⁸ cmformula presented at 10 Hz, respectively, without any poling treatment.

Original language	English
Pages (from-to)	2453-2458
Number of pages	6
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	34
Issue number	5R
DOIs	https://doi.org/10.1143/JJAP.34.2453
State	Published - May 1995

Keywords

C-axis orientation
Infrared sensor
Percolating Pt network
PLT thin film

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10.1143/JJAP.34.2453

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Lee, D. H., Lee, J. S., Cho, S. M., Nam, H. J., Lee, J. H., Choi, J. R., Kim, K. Y., Kim, S. OKUYAMA., & Okuyama, M. (1995). Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 34(5R), 2453-2458. https://doi.org/10.1143/JJAP.34.2453

@article{1d68263b3820474193da07c565e6cda4,

title = "Microstructures and electrical properties of (Pb, lа)Тio3 thin films grown on the pt electrodes with a percolating network structure",

abstract = "We have investigated the microstructures and electrical properties of Pb0.95, Lа0.05ТiO3 (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm2 and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 108 cmformula presented at 10 Hz, respectively, without any poling treatment.",

keywords = "C-axis orientation, Infrared sensor, Percolating Pt network, PLT thin film",

author = "Lee, \{Don Hee\} and Lee, \{Jeong Soo\} and Cho, \{Sung Moon\} and Nam, \{Hyo Jin\} and Lee, \{Jue Haeng\} and Choi, \{Jun Rim\} and Kim, \{Kwang Young\} and Kim, \{Sung OKUYAMA\} and Masanori Okuyama",

year = "1995",

month = may,

doi = "10.1143/JJAP.34.2453",

language = "English",

volume = "34",

pages = "2453--2458",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

issn = "0021-4922",

publisher = "Institute of Physics",

number = "5R",

}

Lee, DH, Lee, JS, Cho, SM, Nam, HJ, Lee, JH, Choi, JR, Kim, KY, Kim, SOKUYAMA & Okuyama, M 1995, 'Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 34, no. 5R, pp. 2453-2458. https://doi.org/10.1143/JJAP.34.2453

Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure. / Lee, Don Hee; Lee, Jeong Soo; Cho, Sung Moon et al.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 34, No. 5R, 05.1995, p. 2453-2458.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Microstructures and electrical properties of (Pb, lа)Тio3 thin films grown on the pt electrodes with a percolating network structure

AU - Lee, Don Hee

AU - Lee, Jeong Soo

AU - Cho, Sung Moon

AU - Nam, Hyo Jin

AU - Lee, Jue Haeng

AU - Choi, Jun Rim

AU - Kim, Kwang Young

AU - Kim, Sung OKUYAMA

AU - Okuyama, Masanori

PY - 1995/5

Y1 - 1995/5

N2 - We have investigated the microstructures and electrical properties of Pb0.95, Lа0.05ТiO3 (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm2 and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 108 cmformula presented at 10 Hz, respectively, without any poling treatment.

AB - We have investigated the microstructures and electrical properties of Pb0.95, Lа0.05ТiO3 (PLT) thin films deposited on the (100)-oriented Pt/(100)MgO substrates by rf magnetron sputtering and have fabricated a thin film infrared sensor. The (100)-oriented Pt film is formed via a coalescence of Pt islands and the Pt layer goes through a transition from nonconducting islands to a conductive percolating network as the Pt deposition time increases. The highly c-axis oriented PLT thin film has been successfully grown on the Pt bottom electrode with a network structure. The PLT thin film on the interconnected percolating Pt network exhibits a well saturated ferroelectric hysteresis loop with the remanent polarization of 1.6 μC/cm2 and the coercive field of 70 kV/cm. The responsivity and detectivity of the thin film infrared sensor are 700 V/W and 6 x 108 cmformula presented at 10 Hz, respectively, without any poling treatment.

KW - C-axis orientation

KW - Infrared sensor

KW - Percolating Pt network

KW - PLT thin film

UR - https://www.scopus.com/pages/publications/0029308229

U2 - 10.1143/JJAP.34.2453

DO - 10.1143/JJAP.34.2453

M3 - Article

AN - SCOPUS:0029308229

SN - 0021-4922

VL - 34

SP - 2453

EP - 2458

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 5R

ER -

Microstructures and electrical properties of (Pb, lа)Тio₃ thin films grown on the pt electrodes with a percolating network structure

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