Microwave imaging reflectometry for density fluctuation measurement on KSTAR

W. Lee, J. Leem, J. A. Lee, Y. B. Nam, M. Kim, G. S. Yun, H. K. Park, Y. G. Kim, H. Park, K. W. Kim, C. W. Domier, N. C. Luhmann, K. D. Lee, Y. U. Nam, W. H. Ko, J. H. Jeong, Y. S. Bae

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